TY  JOUR
TI  Calculation-experimental determination of CMOS- integrated microcircuits’ radiation hardness under the influence of gamma radiation
KW  radiation hardness
KW  integrated microcircuit
KW  transistor
KW  gamma radiation
KW  forecasting
JO  Infocommunications and Radio Technologies
AU  Bogatyrev, Y.V.
AU  Lastovski, S.B.
AU  Shwedov, S.V.
AU  Lozitski, E.G.
PY  2018
IS  1
PB  Federal State Educational Institution of Higher Education Sevastopol State University