@article{Savin2019method,
author={Savin, A..},
title={Method of metrological characteristics determination of probe system for wafer-level S-parameters measurement of microwave nanoelectronic devices},
journal={Infocommunications and Radio Technologies},
publisher={Federal State Educational Institution of Higher Education Sevastopol State University},
year={2019},
pages={60-70},
volume={2},
issue={1},
}