<!DOCTYPE article
PUBLIC "-//NLM//DTD JATS (Z39.96) Journal Publishing DTD v1.4 20190208//EN"
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<article xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" article-type="research-article" dtd-version="1.4" xml:lang="en">
 <front>
  <journal-meta>
   <journal-id journal-id-type="publisher-id">Infocommunications and Radio Technologies</journal-id>
   <journal-title-group>
    <journal-title xml:lang="en">Infocommunications and Radio Technologies</journal-title>
    <trans-title-group xml:lang="ru">
     <trans-title>ИНФОКОММУНИКАЦИОННЫЕ И РАДИОЭЛЕКТРОННЫЕ ТЕХНОЛОГИИ</trans-title>
    </trans-title-group>
   </journal-title-group>
   <issn publication-format="print">2587-9936</issn>
  </journal-meta>
  <article-meta>
   <article-id pub-id-type="publisher-id">53539</article-id>
   <article-id pub-id-type="doi">10.29039/2587-9936.2022.05.4.34</article-id>
   <article-categories>
    <subj-group subj-group-type="toc-heading" xml:lang="ru">
     <subject>Электроника, фотоника, приборостроение и связь (2.2)</subject>
    </subj-group>
    <subj-group subj-group-type="toc-heading" xml:lang="en">
     <subject>ELECTRONICS, PHOTONICS, INSTRUMENTATION AND COMMUNICATIONS (2.2)</subject>
    </subj-group>
    <subj-group>
     <subject>Электроника, фотоника, приборостроение и связь (2.2)</subject>
    </subj-group>
   </article-categories>
   <title-group>
    <article-title xml:lang="en">The Use of Microwave Measurements for Sorting the Constituent Elements of Archaeological Objects</article-title>
    <trans-title-group xml:lang="ru">
     <trans-title>Применение СВЧ измерений для сортировки составных элементов археологических объектов</trans-title>
    </trans-title-group>
   </title-group>
   <contrib-group content-type="authors">
    <contrib contrib-type="author">
     <contrib-id contrib-id-type="orcid">https://orcid.org/0000-0003-2898-960X</contrib-id>
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Полетаев</surname>
       <given-names>Дмитрий Александрович</given-names>
      </name>
      <name xml:lang="en">
       <surname>Poletaev</surname>
       <given-names>Dmitrii A.</given-names>
      </name>
     </name-alternatives>
     <email>poletaevda@cfuv.ru</email>
     <xref ref-type="aff" rid="aff-1"/>
    </contrib>
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Мальцев</surname>
       <given-names>Константин Сергеевич</given-names>
      </name>
      <name xml:lang="en">
       <surname>Maltsev</surname>
       <given-names>Konstantin S.</given-names>
      </name>
     </name-alternatives>
     <xref ref-type="aff" rid="aff-2"/>
    </contrib>
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Майко</surname>
       <given-names>Вадим Владиславович</given-names>
      </name>
      <name xml:lang="en">
       <surname>Maiko</surname>
       <given-names>Vadim V.</given-names>
      </name>
     </name-alternatives>
     <xref ref-type="aff" rid="aff-3"/>
    </contrib>
    <contrib contrib-type="author">
     <name-alternatives>
      <name xml:lang="ru">
       <surname>Власов</surname>
       <given-names>Владимир Петрович</given-names>
      </name>
      <name xml:lang="en">
       <surname>Vlasov</surname>
       <given-names>Vladimir P.</given-names>
      </name>
     </name-alternatives>
     <xref ref-type="aff" rid="aff-4"/>
    </contrib>
   </contrib-group>
   <aff-alternatives id="aff-1">
    <aff>
     <institution xml:lang="ru">Крымский федеральный университет им. В. И. Вернадского</institution>
     <city>Симферополь</city>
     <country>Россия</country>
    </aff>
    <aff>
     <institution xml:lang="en">V.I. Vernadsky Crimean Federal University</institution>
     <city>Simferopol</city>
     <country>Russian Federation</country>
    </aff>
   </aff-alternatives>
   <aff-alternatives id="aff-2">
    <aff>
     <institution xml:lang="ru">Крымский федеральный университет им. В. И. Вернадского</institution>
     <city>Симферополь</city>
     <country>Россия</country>
    </aff>
    <aff>
     <institution xml:lang="en">V.I. Vernadsky Crimean Federal University</institution>
     <city>Simferopol</city>
     <country>Russian Federation</country>
    </aff>
   </aff-alternatives>
   <aff-alternatives id="aff-3">
    <aff>
     <institution xml:lang="ru">Институт археологии Крыма РАН</institution>
     <city>Симферополь</city>
     <country>Россия</country>
    </aff>
    <aff>
     <institution xml:lang="en">Institute of Archaeology of Crimea RAS</institution>
     <city>Simferopol</city>
     <country>Russian Federation</country>
    </aff>
   </aff-alternatives>
   <aff-alternatives id="aff-4">
    <aff>
     <institution xml:lang="ru">Институт археологии Крыма РАН</institution>
     <city>Симферополь</city>
     <country>Россия</country>
    </aff>
    <aff>
     <institution xml:lang="en">Institute of Archaeology of Crimea RAS</institution>
     <city>Simferopol</city>
     <country>Russian Federation</country>
    </aff>
   </aff-alternatives>
   <pub-date publication-format="print" date-type="pub" iso-8601-date="2022-10-21T15:13:06+03:00">
    <day>21</day>
    <month>10</month>
    <year>2022</year>
   </pub-date>
   <pub-date publication-format="electronic" date-type="pub" iso-8601-date="2022-10-21T15:13:06+03:00">
    <day>21</day>
    <month>10</month>
    <year>2022</year>
   </pub-date>
   <volume>5</volume>
   <issue>4</issue>
   <fpage>458</fpage>
   <lpage>471</lpage>
   <history>
    <date date-type="received" iso-8601-date="2022-05-21T00:00:00+03:00">
     <day>21</day>
     <month>05</month>
     <year>2022</year>
    </date>
    <date date-type="accepted" iso-8601-date="2022-06-05T00:00:00+03:00">
     <day>05</day>
     <month>06</month>
     <year>2022</year>
    </date>
   </history>
   <self-uri xlink:href="https://rusjbpc.ru/en/nauka/article/53539/view">https://rusjbpc.ru/en/nauka/article/53539/view</self-uri>
   <abstract xml:lang="ru">
    <p>В работе рассматривается конструкция коаксиального резонансного измерительного преобразователя с укорачивающей емкостью, применяемого для определения электрофизических параметров составных элементов археологических объектов. На основании численной модели определены оптимальные геометрические размеры резонансного датчика. Проведен анализ основных характеристик измерительного преобразователя. Получен ряд экспериментальных данных, подтверждающих применимость предложенной методики.</p>
   </abstract>
   <trans-abstract xml:lang="en">
    <p>In this paper the design of a coaxial resonant measuring converter with a shortening capacitance used to determine the electrophysical parameters of the constituent elements of archaeological objects is proposed. Based on the numerical model, the optimal geometric dimensions of the resonant sensor are determined. The analysis of the main characteristics of the measuring transducer is carried out. A number of experimental data were obtained confirming the applicability of the proposed technique.</p>
   </trans-abstract>
   <kwd-group xml:lang="ru">
    <kwd>археологический объект</kwd>
    <kwd>СВЧ резонатор</kwd>
    <kwd>резонансный измерительный преобразователь</kwd>
    <kwd>апертура</kwd>
    <kwd>характеристика преобразования</kwd>
   </kwd-group>
   <kwd-group xml:lang="en">
    <kwd>archaeological object</kwd>
    <kwd>microwave resonator</kwd>
    <kwd>resonant measuring converter</kwd>
    <kwd>aperture</kwd>
    <kwd>conversion characteristic</kwd>
   </kwd-group>
  </article-meta>
 </front>
 <body>
  <p></p>
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