UDC 62

CALCULATION-EXPERIMENTAL DETERMINATION OF CMOS- INTEGRATED MICROCIRCUITS’ RADIATION HARDNESS UNDER THE INFLUENCE OF GAMMA RADIATION Calculation-experimental determination of CMOS- integrated microcircuits’ radiation hardness under the influence of gamma radiation

Published in Infocommunications and Radio Technologies · Volume 1, Issue 1 · Pages 95–102 · Rubric: ELECTRONICS (05.27.00)
DOI: https://doi.org/10.15826/icrt.2018.01.1.07
Received: 20.03.2018 Accepted: 25.03.2018 Published: 25.03.2018 Language of publication: RUS
The results of calculation-experimental determination (forecasting) of two types of CMOS-integrated microcircuits’ radiation hardness (interface transceivers, memory units) under the influence of Co60 gamma radiation are submitted. Analytical dose dependences of parameters of test MOS transistors and CMOS large-scale integrated circuits are obtained.
radiation hardness, integrated microcircuit, transistor, gamma radiation, forecasting
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